Бази даних


Наукова періодика України - результати пошуку


Mozilla Firefox Для швидкої роботи та реалізації всіх функціональних можливостей пошукової системи використовуйте браузер
"Mozilla Firefox"

Вид пошуку
Повнотекстовий пошук
 Знайдено в інших БД:Реферативна база даних (19)
Список видань за алфавітом назв:
A  B  C  D  E  F  G  H  I  J  L  M  N  O  P  R  S  T  U  V  W  
А  Б  В  Г  Ґ  Д  Е  Є  Ж  З  И  І  К  Л  М  Н  О  П  Р  С  Т  У  Ф  Х  Ц  Ч  Ш  Щ  Э  Ю  Я  

Авторський покажчик    Покажчик назв публікацій



Пошуковий запит: (<.>A=Vlaskina S$<.>)
Загальна кількість знайдених документів : 11
Представлено документи з 1 до 11
1.

Lee S. W. 
Silicon carbide defects and luminescence centers in current heated 6H-SiC [Електронний ресурс] / S. W. Lee, S. I. Vlaskina, V. I. Vlaskin, I. V. Zaharchenko, V. A. Gubanov, G. N. Mishinova, G. S. Svechnikov, V. E. Rodionov, S. A. Podlasov // Semiconductor physics, quantum electronics & optoelectronics. - 2010. - Vol. 13, № 1. - С. 24-29. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2010_13_1_7
At room temperature yellow photoluminescence with a broad peak of 2,13 eV is a well-known feature of boron-doped 6H-SiC. Usually yellow luminescence is regarded as recombination involving both the boron-related deep acceptor and donor level. But the nature of the deep level has not been clearly understood yet. We annealed 6H-SiC substrates by current in vacuum without boron injection at the temperature of 1350 and 1500 <$E symbol Р>C. We received red and yellow luminescence in PL spectrum for the heated 6H-SiC. The luminescence was regarded as donor-acceptor pair recombination involving the deep aluminum acceptor related to the adjacent carbon vacancies and nitrogen donor or the formation of quantum well like regions of 3C-SiC in 6H-SiC matrix.
Попередній перегляд:   Завантажити - 394.176 Kb    Зміст випуску    Реферативна БД     Цитування
2.

Vlaskina S. I. 
3C-6H transformation in heated cubic silicon carbide 3C-SiC [Електронний ресурс] / S. I. Vlaskina, G. N. Mishinova, V. I. Vlaskin, V. E. Rodionov, G. S. Svechnikov // Semiconductor physics, quantum electronics & optoelectronics. - 2011. - Vol. 14, № 4. - С. 432-436 . - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2011_14_4_12
Results of the research on the photoluminescence study of the 3C-6H-SiC phase transformation are presented. 3C-SiC crystals with in grown 3C-6H transformation and pure perfect 3C-SiC crystals grown by the Tairov-Tsvetkov method without a polytypes joint after high temperature annealing were investigated. Fine structure at the energy of E = 2,73, 2,79 eV, E = 2,588 eV, and E = 2,48 eV that appeared after annealing was described. The role of stacking faults in the process of structure transformation was investigated.
Попередній перегляд:   Завантажити - 2.537 Mb    Зміст випуску    Реферативна БД     Цитування
3.

Vlaskina S. I. 
Silicon carbide phase transition in as-grown 3C-6H polytypes junction [Електронний ресурс] / S. I. Vlaskina, G. N. Mishinova, V. I. Vlaskin, G. S. Svechnikov, V. E. Rodionov, S. W. Lee // Semiconductor physics, quantum electronics & optoelectronics. - 2013. - Vol. 16, № 2. - С. 132-135. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2013_16_2_8
Perfect pure (concentration of donors ~10<^>16 cm<^>-3 ) single crystals with joint polytypes (hexagonal-cubic) or heterojunction investigated using low temperature (4,2 К and 77 K) photoluminescence. Phase transformation started exactly from lamella between polytypes. <$Ebeta ~symbol О~ alpha> (3C-6H) SiC transformation distributes from lamella as from nuclear. Photoluminescence spectra are similar to the spectrum demonstrated by pure perfect 3C-SiC crystal in the field of mechanical deformation. In the zone of joint polytypes and zone of the plastic deformation in perfect 3C-SiC crystal after bending, the same stacking faults are localized. Luminescence in the disordered <$Ealpha>-zone as a result of phase transformation is represented by a set of intensely pronounced stacking fault spectra. These spectra reside on more or less intense background band, which are emission of the donor-acceptor pairs in SiC. Excitation luminescence spectra confirm appearance of stacking faults which are responsible for metastable intermediate micro- and nano-SiC structures. Solid-phase transformations <$Ebeta ~symbol О~ alpha> are related with the same intermediate metastable microstructure that take place in the transformation <$Ealpha ~symbol О~ beta>.
Попередній перегляд:   Завантажити - 340.777 Kb    Зміст випуску    Реферативна БД     Цитування
4.

Vlaskina S. I. 
8H-, 10H-, 14H-SiC formation in 6H-3C silicon carbide phase transitions [Електронний ресурс] / S. I. Vlaskina, G. N. Mishinova, V. I. Vlaskin, V. E. Rodionov, G. S. Svechnikov // Semiconductor physics, quantum electronics & optoelectronics. - 2013. - Vol. 16, № 3. - С. 273-279. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2013_16_3_9
Попередній перегляд:   Завантажити - 2.54 Mb    Зміст випуску     Цитування
5.

Vlaskina S. I. 
Nanostructures in lightly doped silicon carbide crystals with polytypic defects [Електронний ресурс] / S. I. Vlaskina, G. N. Mishinova, L. V. Vlaskin, V. E. Rodionov, G. S. Svechnikov // Semiconductor physics, quantum electronics & optoelectronics. - 2014. - Vol. 17, № 2. - С. 155-159. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2014_17_2_7
In this work, photoluminescence spectra of lightly doped SiC crystals with ingrown original defects ar reported. Undoped SiC single crystals with the impurity concentration of <$EN sub D~-~N sub A> ~ <$E(2~-~8)~cdot~10 sup 16~roman cm sup -3>, <$E N sub A> ~ <$E (2~-~8)~cdot~10 sup 17~roman cm sup -3>, and <$E N sub D~-~N sub A> ~ <$E (1~-~5)~cdot~10 sup 17~roman cm sup -3>, <$E N sub D~symbol Г~1~cdot~10 sup 18~roman cm sup -3> were investigated. The analysis of absorption, excitation and low temperature photoluminescence spectra suggests formation of a new micro-phase during the growth process and appearance of the deep-level (DL) spectra. The complex spectra of the crystals can be decomposed into the so-called DLi (i = 1, 2, 3, 4) spectra. The appearance of the DLi spectrum is associated with formation of new nano-phases. Data of photoluminescence, excitation and absorption spectra show the uniformity of different DLi spectra. Structurally, the general complexity of the DLi spectra correlated with the degree of disorder of the crystal and was connected with onedimensional disorder, the same as in the case of the stacking fault (SFi) spectra. The DLi spectra differ from SFi spectra and have other principles of construction and behavior. The DLi spectra are placed on a broad donor-acceptor pairs emission band in crystals with higher concentrations of non-compensated impurities. The excitation spectra for the DLi and SFi spectra coincide and indicate formation of nanostructures <$E14 roman H sub 1 symbol ... 4334 symbol ъ>, <$E10 roman H sub 2 symbol ... 55 symbol ъ>, <$E 14 roman H sub 2 symbol ... 77 symbol ъ>, <$E8 roman H sub 1 symbol ... 44 symbol ъ>.
Попередній перегляд:   Завантажити - 2.957 Mb    Зміст випуску    Реферативна БД     Цитування
6.

Vlaskina S. I. 
Peculiarities of phase transformations of SiC crystals and thin films with in-grown original defects [Електронний ресурс] / S. I. Vlaskina, G. N. Mishinova, V. E. Rodionov, G. S. Svechnikov // Semiconductor physics, quantum electronics & optoelectronics. - 2014. - Vol. 17, № 4. - С. 380-383. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2014_17_4_14
Phase transformations of SiC crystals and thin films with in-grown original defects have been studied. The analysis of absorption, excitation and low-temperature photoluminescence spectra testifies to formation of new micro-phases during the growth. The complex spectra can be decomposed into similar structure-constituting spectra shifted against each other on the energy scale. These spectra are indicative of formation of new nanophases. Taking into account the position of the short-wave edge in the zero-phonon part of the SF-i spectra as well as the position of corresponding excitation spectra and placing them on the well-known linear dependence of the exciton gap (Egx) on the percentage of hexagonally in different polytypic structures, one can obtain a hint to the percentage of hexagonally in the new metastable structures appearing in the 6H (33) matrix or in the growth process. The SF spectra are indicative of the appearance of these metastable structures.
Попередній перегляд:   Завантажити - 2.119 Mb    Зміст випуску    Реферативна БД     Цитування
7.

Vlaskina S. I. 
Structure of photoluminescence DL-spectra and phase transformation in lightly doped SiC crystals and films [Електронний ресурс] / S. I. Vlaskina, G. N. Mishinova, V. I. Vlaskin, V. E. Rodionov, G. S. Svechnikov // Semiconductor physics, quantum electronics & optoelectronics. - 2015. - Vol. 18, № 2. - С. 209-214. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2015_18_2_20
In this work, the results of investigations of DLi spectra in alpha-SiC crystals and films with a low impurity concentration have been presented. Photoluminescence spectra of lightly doped SiC single crystals and films with the impurity concentration of ND - NA ~ <$E(2~-~8)~cdot~10 sup 16 ~roman cm sup -3>, ND ~ <$E(5~-~8)~cdot~10 sup 17 ~roman cm sup -3>, and <$EN sub D ~-~N sub A ~>>~3~cdot~10 sup 17 ~roman cm sup -3>, <$EN sub D ~symbol У~1~cdot~10 sup 18 ~roman cm sup -3> (NDL-samples) were investigated within the temperature range 4,2 - 77 K. Complex spectroscopic study of one-dimensional disordered structures caused by solid phase transformations in SiC crystals was presented. Disordered growth D-layers in lightly doped crystals and alpha-SiC films were investigated using low temperature photoluminescence. The analysis testifies that DL and SF spectra hand-in-hand follow the structure transformations. It has been shown that the DL and SF spectra of luminescence reflect the fundamental logic of SiC polytypes structure. This allows to observe the structure changes at the phase transformations, the growth of SiC polytypes and to control their aggregates.
Попередній перегляд:   Завантажити - 377.522 Kb    Зміст випуску    Реферативна БД     Цитування
8.

Vlaskina S. I. 
External impacts on SiC nanostructures in pure and lightly doped silicon carbide crystals [Електронний ресурс] / S. I. Vlaskina, G. N. Mishinova, V. I. Vlaskin, V. E. Rodionov, G. S. Svechnikov // Semiconductor physics, quantum electronics & optoelectronics. - 2015. - Vol. 18, № 4. - С. 448-451. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2015_18_4_15
Influence of plastic deformation and high-temperature annealing (<$ET~=~2100~symbol Р roman C>, t = 1 h) on SiC crystals with grown polytypic junctions demonstrating SF and DL spectra have been presented. SF-i and DL-i type luminescence are inherent to SiC crystals with distortions of the structure related with availability of packing defects that lead to onedimensional disordering (along the c-axis). They are a most expressed in doped crystals with original growth defects. DL luminescence appears in pure crystals at plastic deformation and in doped crystals at a hydrostatic pressure. It enhances at the high temperature annealing, too.
Попередній перегляд:   Завантажити - 374.788 Kb    Зміст випуску    Реферативна БД     Цитування
9.

Vlaskina S. I. 
Nanocrystalline silicon carbide films for solar cells [Електронний ресурс] / S. I. Vlaskina, G. N. Mishinova, V. I. Vlaskin, V. E. Rodionov, G. S. Svechnikov // Semiconductor physics, quantum electronics & optoelectronics. - 2016. - Vol. 19, № 3. - С. 273-278. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2016_19_3_7
Nanocrystalline silicon carbide (nc-SiC) films as protective coating and as solar cell material for a harsh environment, high temperatures, light intensities and radiation, were investigated, p- and n-types 100-mm silicon wafers with (100) orientation were used as substrates for SiC films deposition. The films were deposited using High-Frequency Plasma Enhanced Chemical Vapor Deposition (HF-PECVD) with CH3SiCl3 gas as a silicon and carbon source. Hydrogen supplied CH3SiCl3 molecules in the field of HF discharge. Deposition was carried out on a cold substrate. The power density was 12,7 W/cm2. Deposition conditions were explored to prepare films with a controlled band gap and a low defect density. Formation of nc-3C-SiC films has been confirmed by the high resolution-transmission electron microscopy analysis, optical band gap values ETauc, conductivity, charge carrier activation energy and Hall measurements. The efficiency of photoconductivity was calculated for evaluating the photoconductivity properties and for the correlations with technology. For p-n junction creation in solar cell fabrication, the n-types nc-SiC films were doped with Al. Employing Al as a doping material of nc-n-SiC, the open-circuit voltage as high as 1,43 V has been achieved.
Попередній перегляд:   Завантажити - 556.895 Kb    Зміст випуску    Реферативна БД     Цитування
10.

Vlaskina S. I. 
Peculiarities of photoluminescence spectra behavior in SiC crystals and films during phase transformations [Електронний ресурс] / S. I. Vlaskina, G. N. Mishinova, V. I. Vlaskin, V. E. Rodionov, G. S. Svechnikov // Semiconductor physics, quantum electronics & optoelectronics. - 2016. - Vol. 19, № 1. - С. 62-66. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2016_19_1_14
Peculiarities of photoluminescence spectra behavior in SiC crystals and thin films with in-grown defects during phase transformations have been studied. On the deep-level(DL)-spectra, as an example, their characteristics and behavior were investigated. It has been shown that all DL spectra have the same logic of construction and demonstrate identical behavior of the thin structure elements.
Попередній перегляд:   Завантажити - 350.266 Kb    Зміст випуску    Реферативна БД     Цитування
11.

Vlaskina S. I. 
Nanograin boundaries and silicon carbide photoluminescence [Електронний ресурс] / S. I. Vlaskina, G. N. Mishinova, V. I. Vlaskin, V. E. Rodionov, G. S. Svechnikov // Semiconductor physics, quantum electronics & optoelectronics. - 2017. - Vol. 20, № 3. - С. 344-348. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2017_20_3_13
The luminescence spectra of SiC crystals and films with grain boundaries (GB) on the atomic level were observed. The GB spectra are associated with luminescence centers localized in areas of specific structural abnormalities in the crystal, without no reference to the one-dimensional layer-disordering. The zero-phonon part of GB spectra is always within the same energy range (2,890 - 2,945 eV) and does not fit in the dependence of its position in the energy scale on the percent of hexagonality as in the case of stacking faults (SFi) and deep level (DLi) spectra. The zero-phonon part 2,945 - 2,890 eV with a fine structure is better observed in crystals with the centers of origin growth of crystal, if ND - NA ~ <$E(2~-~8)~cdot~10 sup 16> cm<^>-3, ND ~ <$E(2~-~7)~cdot~10 sup 17> cm<^>-3. The edge phonons of the Brillouin zone TA-46 meV, LA-77 meV, TO-95 meV and LO-104 meV are involved in development of the GB spectrum. This spectrum may occur simultaneously with the DLi and SFi ones. The GB spectra also occur after high temperature processing the <$Ebeta>-phase (in the 3C-SiC) with appearance of the <$Ealpha>-phase. The temperature range of observation is 4,2 - 40 K. There is synchronous thermal quenching of all elements in the fine structure. The thermal activation energy of quenching is <$EE sub a sup T> ~ 7 meV.
Попередній перегляд:   Завантажити - 407.245 Kb    Зміст випуску    Реферативна БД     Цитування
 
Відділ наукової організації електронних інформаційних ресурсів
Пам`ятка користувача

Всі права захищені © Національна бібліотека України імені В. І. Вернадського