The multiangular ellipsometric measurements were performed at two wavelengths 435 and 579 nm on the system that contains cadmium telluride film deposited onto the monocrystalline silicon substrate. The refractive index and the film thickness as well as their distribution over the sample area were determined. It has been shown that the refractive index of the film (2,15 - 2,35) is less than the refractive index of the monocrystalline cadmium telluride (~3) that can testify the porous structure of the film or about roughness of the film surface. Obtained dependences of values of the film optical parameters from the angle of incidence testify weak heterogeneity of film properties along its depth. It was detected that there are the false decisions of the ellipsometric equation for each angle of incidence.

• Сизов Федір Федорович (1946–) (фізико-математичні науки)
• Вуйчик Микола В'ячеславович (фізико-математичні науки)

  Якщо, ви не знайшли інформацію про автора(ів) публікації, маєте бажання виправити або відобразити більш докладну інформацію про науковців України запрошуємо заповнити "Анкету науковця"