Kolomys O. Optical and structural studies of phase transformations and composition fluctuations at annealing of Zn1-xCdxO films grown by dc magnetron sputtering / O. Kolomys, A. Romanyuk, V. Strelchuk, G. Lashkarev, O. Khyzhun, I. Timofeeva, V. Lazorenko, V. Khomyak // Semiconductor Physics, Quantum Electronics and Optoelectronics. - 2014. - 17, № 3. - С. 275-283. - Бібліогр.: 28 назв. - англ.Ternary Zn1-xCdxO (<$Ex~symbol Г~0,12>) alloy crystalline films with highly preferred orientation (002) have been successfully deposited on sapphire c-Al2O3 substrates using the direct current (dc) reactive magnetron sputtering technique and annealed at temperature 600 C in air. The structural and optical properties of Zn1-xCdxO thin films were systematically studied using X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), micro-Raman and photoluminescent (PL) spectroscopy. XPS measurements clearly confirmed Cd incorporation into ZnO lattice. XRD data revealed that the growth of wurtzite Zn1-xCdxO films occurs preferentially in the (002) direction. Also, when the Cd content is increased, the XRD peaks shift towards smaller angles and the full width at half-maximum of the lines increases. When the Cd content increases, <$EA sub 1 sup roman LO ( {roman Zn} sub 1-x {roman Cd} sub x roman O)>-like Raman modes show composition dependent frequency decrease and asymmetrical broadening. The near band-edge PL emission at room temperature shifts gradually to lower energies as the Cd content increases and reaches 2,68 eV for the highest Cd content (x = 0,12). The analysis of NBE band emission and Raman <$EA sub 1 sup roman LO ( {roman Zn} sub 1-x {roman Cd} sub x roman O)> mode shows that at a higher Cd content the coexistence of Zn1-xCdxO areas with different concentrations of Cd inside the same film occurs. The presence of CdO in annealed Zn1-xCdxO films with the higher Cd content was confirmed by Raman spectra of cubic CdO nanoinclusions. The XRD data also revealed phase segregation of cubic CdO in annealed Zn1-xCdxO films (Tann = 600 C) for <$Ex~symbol У~0,13>. Індекс рубрикатора НБУВ: В379.226 + В379.247
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